Interface-layer formation mechanism in (formula presented) thin-film growth studied by real-time spectroscopic ellipsometry and infrared spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 19, 1999, Pages 13598-13604

  Fujiwara, H ^a   Toyoshima, Y ^a   Kondo, M ^a   Matsuda, A ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000294133     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.13598     Document Type: Article

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