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Volumn 3, Issue 1-3, 1996, Pages 123-130

Scanning force microscopic study of surface structure and properties of (alkylsilane/fluoroalkylsilane) mixed monolayers

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; MECHANICAL PROPERTIES; MOLECULAR DYNAMICS; MONOLAYERS; PHASE SEPARATION; SILANES; SUBSTRATES; SURFACE PROPERTIES; SURFACE STRUCTURE;

EID: 0030108772     PISSN: 09685677     EISSN: None     Source Type: Journal    
DOI: 10.1016/0968-5677(96)00024-7     Document Type: Article
Times cited : (36)

References (15)
  • 15
    • 85114534726 scopus 로고    scopus 로고
    • Ge, S.R., Kojio, K., Nakamura, K., Takahara, A. and Kajiyama, T. Langmuir (submitted)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.