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Volumn 70, Issue 6, 1997, Pages 759-761

Fermi-level pinning position at the Au-InAs interface determined using ballistic electron emission microscopy

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EID: 0001342096     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118271     Document Type: Article
Times cited : (54)

References (16)
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    • 0001021351 scopus 로고
    • For a recent review of BEEM, see M. Prietsch, Phys. Rep. 253, 163 (1995).
    • (1995) Phys. Rep. , vol.253 , pp. 163
    • Prietsch, M.1
  • 8
    • 4243292542 scopus 로고
    • M. Prietsch and R. Ludeke, Phys. Rev. Lett. 66, 2511 (1991); L. J. Schowalter and E. Y. Lee, Phys. Rev. B 43, 9308 (1991); G. N. Henderson, P. N. First, T. K. Gaylord, and E. N. Glytsis, Phys. Rev. Lett. 71, 2999 (1993).
    • (1991) Phys. Rev. Lett. , vol.66 , pp. 2511
    • Prietsch, M.1    Ludeke, R.2
  • 9
    • 0000138916 scopus 로고
    • M. Prietsch and R. Ludeke, Phys. Rev. Lett. 66, 2511 (1991); L. J. Schowalter and E. Y. Lee, Phys. Rev. B 43, 9308 (1991); G. N. Henderson, P. N. First, T. K. Gaylord, and E. N. Glytsis, Phys. Rev. Lett. 71, 2999 (1993).
    • (1991) Phys. Rev. B , vol.43 , pp. 9308
    • Schowalter, L.J.1    Lee, E.Y.2
  • 13
    • 0001533024 scopus 로고
    • C. Alibert, A. Joullie, A. M. Joullie, and C. Ance, Phys. Rev. B 27, 4946 (1983); Numerical Data and Functional Relationships in Science and Technology, Landolt-Bornstein, Vol. 17: Semiconductors (Springer, Berlin, 1982).
    • (1983) Phys. Rev. B , vol.27 , pp. 4946
    • Alibert, C.1    Joullie, A.2    Joullie, A.M.3    Ance, C.4
  • 14
    • 0001533024 scopus 로고
    • Numerical Data and Functional Relationships in Science and Technology
    • Springer, Berlin
    • C. Alibert, A. Joullie, A. M. Joullie, and C. Ance, Phys. Rev. B 27, 4946 (1983); Numerical Data and Functional Relationships in Science and Technology, Landolt-Bornstein, Vol. 17: Semiconductors (Springer, Berlin, 1982).
    • (1982) Landolt-Bornstein, Vol. 17: Semiconductors , vol.17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.