SCOPUS 정보 검색 플랫폼

Superlattices and Microstructures

Volumn 36, Issue 4-6, 2004, Pages 537-545

Structural and optical characterisation of InN layers grown by MOCVD

(8) Singh, P a Ruterana, P a Morales, M a Goubilleau, F a Wojdak, M b Carlin, J F c Ilegems, M c Chateigner, D d

a UNIVERSITÉ DE CAEN (France)

b UNIVERSITÉ DE CAEN (France)

c EPFL (Switzerland)

d LABORATOIRE CRISMAT (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CARRIER MOBILITY; CRYSTAL STRUCTURE; ENERGY GAP; FILM GROWTH; HALL EFFECT; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SURFACE ROUGHNESS; THICKNESS MEASUREMENT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

HALL MOBILITY; INN; ROOM TEMPERATURE;

INDIUM COMPOUNDS;

EID: 9944248536 PISSN: 07496036 EISSN: None Source Type: Journal
DOI: 10.1016/j.spmi.2004.10.002 Document Type: Article

Times cited : (31)

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