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Volumn 85, Issue 16, 2004, Pages 3462-3464

Suppressed surface morphology instabilities in amorphous hydrogenated silicon deposition

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS HYDROGENATED SILICON DEPOSITION; HELIUM ION BOMBARDMENT; HOPPING RATE; HYDROGEN-PASSIVATED SURFACE;

EID: 9744282638     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1808495     Document Type: Article
Times cited : (10)

References (18)
  • 10
    • 9744262760 scopus 로고    scopus 로고
    • Ph.D. thesis, Rensselaer Polytechnic Institute (unpublished)
    • G. T. Dalakos, J. L. Plawsky, and P. D. Persans, Ph.D. thesis, Rensselaer Polytechnic Institute, 2004 (unpublished).
    • (2004)
    • Dalakos, G.T.1    Plawsky, J.L.2    Persans, P.D.3
  • 11
    • 9744274773 scopus 로고    scopus 로고
    • G. T. Dalakos, J. L. Plawsky, and P. D. Persans (unpublished)
    • G. T. Dalakos, J. L. Plawsky, and P. D. Persans (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.