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Volumn 85, Issue 16, 2004, Pages 3462-3464
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Suppressed surface morphology instabilities in amorphous hydrogenated silicon deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS HYDROGENATED SILICON DEPOSITION;
HELIUM ION BOMBARDMENT;
HOPPING RATE;
HYDROGEN-PASSIVATED SURFACE;
COMPUTER SIMULATION;
DATA ACQUISITION;
HELIUM;
HYDROGENATION;
MONTE CARLO METHODS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SURFACE ROUGHNESS;
THIN FILMS;
AMORPHOUS SILICON;
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EID: 9744282638
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1808495 Document Type: Article |
Times cited : (10)
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References (18)
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