X-ray diffraction on laterally modulated (lnAs) n/(AlAs) m short-period superlattices

Journal of Applied Physics

Volumn 96, Issue 9, 2004, Pages 4833-4838

  Caha, O ^a   Krapek V ^a   Holy V ^b   Moss, S C ^c   Li, J H ^c   Norman, A G ^d   Mascarenhas, A ^d   Reno, J L ^e   Stangl, J ^f   Meduna M ^f  

^a MASARYK UNIVERSITY   (Czech Republic)

^b CHARLES UNIVERSITY   (Czech Republic)

^c University of Houston   (United States)

^d NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

^f JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC TERRACES; LATERAL COMPOSITION MODULATION; MONOATOMIC STEPS; VALENCE-FORCE FIELD METHOD;

COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; DETECTORS; ELASTICITY; POLARIZATION; TRANSMISSION ELECTRON MICROSCOPY; VECTORS; X RAY DIFFRACTION ANALYSIS;

SUPERLATTICES;

EID: 9744263202     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1781768     Document Type: Article

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