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At an In composition of 52%, the average scattering factor for the In and Al exactly equals the As scattering factor resulting in zero contrast for the (002) structure factor. See for example, M. A. Hirsch, A. Howie, R. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals, 1967 (unpublished).
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For a compressively strained film, the peaks of the undulation will relax to a larger lattice parameter than in the valleys, as seen in Fig. 1 of A. G. Cullis, MRS Bull. 21 (1996). The reverse is true for a tensilely strained film, i.e., the peaks will relax to a smaller lattice parameter.
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