Synthesis and characterization of copper doped zinc telluride thin films

Solid-State Electronics

Volumn 49, Issue 1, 2005, Pages 3-7

  John, V S ^a,c   Mahalingam, T ^a   Chu, Jinn P ^b  

^a ALAGAPPA UNIVERSITY   (India)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c TDMNS College   (India)

Author keywords

Cu doping; Morphology; Optical; Resistivity; X ray diffraction; Zinc telluride

Indexed keywords

COPPER; CYCLIC VOLTAMMETRY; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRODEPOSITION; MORPHOLOGY; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

BAND GAPS; COPPER (CU) DOPING; CRYSTALLINITY; ZINC TELLURIDE;

THIN FILMS;

EID: 9544226440     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.07.015     Document Type: Article

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