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Volumn 324, Issue 1-2, 1998, Pages 78-84

Effect of Cu-doping on the morphology of ZnTe films electrodeposited from nonaqueous bath

Author keywords

Atomic force microscopy; Electrodeposition; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; CYCLIC VOLTAMMETRY; ELECTRODEPOSITION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; X RAY DIFFRACTION ANALYSIS;

EID: 0032123997     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01209-1     Document Type: Article
Times cited : (29)

References (14)
  • 13
    • 0348001164 scopus 로고    scopus 로고
    • ASTM X-ray powder Data, 15-746, 19-1482, 4-554
    • ASTM X-ray powder Data, 15-746, 19-1482, 4-554.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.