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Volumn 102, Issue 1, 2004, Pages 51-59
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Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
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Author keywords
AFM; Roughness
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Indexed keywords
CORRELATION FUNCTIONS;
MULTIFRACTAL ANALYSIS;
THERMAL OXIDATION;
WAVELET TRANSFORM MODULUS MAXIMA METHOD;
CORRELATION METHODS;
DISSOLUTION;
FRACTALS;
FUNCTIONS;
GALLIUM COMPOUNDS;
OXIDATION;
SPECTRUM ANALYSIS;
SURFACE ROUGHNESS;
SYNTHESIS (CHEMICAL);
THERMODYNAMICS;
WAVELET TRANSFORMS;
ATOMIC FORCE MICROSCOPY;
GALLIUM ARSENIDE;
ANALYTIC METHOD;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
FILM;
FRACTAL ANALYSIS;
MICROSCOPE;
OXIDATION KINETICS;
SIMULATION;
THEORETICAL MODEL;
ALGORITHMS;
ARTIFACTS;
FRACTALS;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, ATOMIC FORCE;
MODELS, THEORETICAL;
SURFACE PROPERTIES;
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EID: 8844239129
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2004.08.005 Document Type: Article |
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Times cited : (18)
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References (12)
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