Description of X-ray powder pattern of turbostratically disordered layer structures with a Rietveld compatible approach

Zeitschrift fur Kristallographie

Volumn 219, Issue 9, 2004, Pages 519-527

  Ufer, Kristian ^a   Roth, Georg ^a   Kleeberg, Reinhard ^b   Stanjek, Helge ^a   Dohrmann, Reiner ^c   Bergmann, Jörg ^d  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b TU BERGAKADEMIE FREIBERG   (Germany)

^c NLfB/BGR   (Germany)

^d NONE   (Germany)

Author keywords

Rietveld method; Smectite; Turbostratic disorder; X ray powder diffraction

Indexed keywords

ANALYTIC METHOD; ARTICLE; CHAOTIC DYNAMICS; DEBYE FORMULA; MATHEMATICAL ANALYSIS; MODEL; QUANTITATIVE ANALYSIS; REFERENCE VALUE; RIETVELD METHOD; TURBOSTRATIC DISORDER; X RAY POWDER DIFFRACTION;

EID: 8744259860     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.219.9.519.44039     Document Type: Article

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