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Volumn 87, Issue 11-12, 2002, Pages 1672-1677

New modeling of X-ray diffraction by disordered lamellar structures, such as phyllosilicates

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; EDGE DISLOCATIONS; LAMELLAR STRUCTURES; SILICATES; TRANSMISSIONS; X RAY DIFFRACTION; X RAY SCATTERING;

EID: 0036874155     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2002-11-1216     Document Type: Article
Times cited : (41)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.