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Volumn 45, Issue 4, 2004, Pages 1060-1064

Fabrication of a novel nano-probe slide for near-field optical microscopy

Author keywords

Nano probe; Near field scanning optical microscopy; Sub wavelength aperture; Throughput

Indexed keywords


EID: 8744257759     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.