Structural, optical, and electrical properties of bulk AlN crystals grown by PVT

Materials Science Forum

Volumn 457-460, Issue II, 2004, Pages 1541-1544

  Bickermann, M ^a   Epelbaum, B M ^a,b   Winnacker, A ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b SICRYSTAL AG   (Germany)

Author keywords

Al precipitation; AlN single crystal; Optical properties; Resistivity; Structural quality

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GAIN CONTROL; OPTICAL MICROSCOPY; PRECIPITATION (CHEMICAL); RATE CONSTANTS; SUBSTRATES;

AL PRECIPITATION; ALN SINGLE CRYSTAL; MICRO-SPECTROSCOPY; STRUCTURAL QUALITY;

SINGLE CRYSTALS;

EID: 8644259223     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.457-460.1541     Document Type: Conference Paper

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