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Volumn 457-460, Issue II, 2004, Pages 985-988
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4H-SiC power Schottky diodes. On the way to solve size limiting issues
a a a b c d d
a
TDI Inc
(United States)
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Author keywords
Micropipe Filling; Power Schottky Diodes; Screw Dislocations
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
DENSITY (SPECIFIC GRAVITY);
DISLOCATIONS (CRYSTALS);
ELECTRIC POTENTIAL;
EPITAXIAL GROWTH;
SCHOTTKY BARRIER DIODES;
X RAY DIFFRACTION ANALYSIS;
MICROPIPE FILLING;
POWER SCHOTTKY DIODES;
SCREW DISLOCATIONS;
SILICON CARBIDE;
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EID: 8644225783
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.457-460.985 Document Type: Conference Paper |
Times cited : (7)
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References (6)
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