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Volumn 457-460, Issue II, 2004, Pages 985-988

4H-SiC power Schottky diodes. On the way to solve size limiting issues

Author keywords

Micropipe Filling; Power Schottky Diodes; Screw Dislocations

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DENSITY (SPECIFIC GRAVITY); DISLOCATIONS (CRYSTALS); ELECTRIC POTENTIAL; EPITAXIAL GROWTH; SCHOTTKY BARRIER DIODES; X RAY DIFFRACTION ANALYSIS;

EID: 8644225783     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.457-460.985     Document Type: Conference Paper
Times cited : (7)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.