Atomic force microscopic measurement of lateral pushing forces during nanomanipulation

Qinghua Daxue Xuebao/Journal of Tsinghua University

Volumn 44, Issue 8, 2004, Pages 1025-1028

  Zhang, Yujun ^a   Li, Peng ^a   Hu, Yuanzhong ^a   Wang, Hui ^a   Huang, Lan ^b  

^a TSINGHUA UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

Atomic force microscope; Carbon nanotubes; Lateral pushing forces measurements; Nanomanipulation

Indexed keywords

ATOMIC FORCE MICROSCOPY; FABRICATION; NANOTECHNOLOGY; NUMERICAL ANALYSIS;

LATERAL PUSHING FORCES MEASUREMENTS; NANOMANIPULATION;

CARBON NANOTUBES;

EID: 8644224960     PISSN: 10000054     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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