Surface topography characterization

Fundamental Principles of Engineering Nanometrology

Volumn , Issue , 2009, Pages 211-262

  Leach, Richard K ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85147063602     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-08-096454-6.10008-9     Document Type: Chapter

References (59)

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