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Volumn 191, Issue 1-4, 2002, Pages 94-105

A comparison of fractal dimensions determined from atomic force microscopy and impedance spectroscopy of anodic oxides on Zr-2.5Nb

(5) McRae, G A a Maguire, M A a Jeffrey, C A a Guzonas, D A a Brown, C A b

a ATOMIC ENERGY OF CANADA LIMITED (Canada)

b Worcester Polytechnic Institute (Canada)

Author keywords

Anodic zirconium oxide; Atomic force microscopy; Electrochemical impedance spectroscopy; Fractal dimensions; Topology

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; FILM GROWTH; OXIDES; SPECTROSCOPIC ANALYSIS; THIN FILMS;

ANODIC OXIDES;

SURFACE TOPOGRAPHY;

EID: 0037123482 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(02)00165-4 Document Type: Article

Times cited : (45)

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