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Volumn 160, Issue , 2012, Pages 9-28

Field Ion Microscopy

Author keywords

Atom Probe Tomography; Crystallographic Direction; Lateral Velocity; Phosphor Screen; Stereographic Projection

Indexed keywords


EID: 85081126153     PISSN: 0933033X     EISSN: 21962812     Source Type: Book Series    
DOI: 10.1007/978-1-4614-3436-8_2     Document Type: Chapter
Times cited : (84)

References (55)
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  • 7
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    • T.T. Tsong, Atom-Probe Field Ion Microscopy: Field Emission, Surfaces and Interfaces at Atomic Resolution (Cambridge University Press, New York, NY, 1990)
    • T.T. Tsong, Atom-Probe Field Ion Microscopy: Field Emission, Surfaces and Interfaces at Atomic Resolution (Cambridge University Press, New York, NY, 1990)
  • 8
    • 0003414179 scopus 로고
    • Springer-Verlag, Berlin Heidelberg
    • R. Wagner, Field-Ion Microscopy (Springer-Verlag, Berlin Heidelberg, 1982)
    • (1982) Field-Ion Microscopy
    • Wagner, R.1
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    • (1962) Philos. Mag. , vol.7 , Issue.78 , pp. 1003-1011
    • Brandon, D.G.1
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    • (1965) Science , vol.149 , Issue.3684 , pp. 591-601
    • M€Uller, E.W.1
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    • E.W. M€uller, S. Nakamura, O. Nishikawa, S.B. McLane, J. Appl. Phys. 36(8), 2496–2503 (1965)
    • (1965) J. Appl. Phys. , vol.36 , Issue.8 , pp. 2496-2503
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    • M.A. Fortes, Surf. Sci. 28(1), 117–131 (1971)
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    • Fortes, M.A.1
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    • Larson, S.S.A. Gerstl (unpublished
    • R.M. Ulfig, D.J. Larson, S.S.A. Gerstl (unpublished, 2008)
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    • M. Wada, Surf. Sci. 145, 451–465 (1984)
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    • Wada, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.