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Volumn 62, Issue 2, 2007, Pages 39-61

Jump processes in surface diffusion

Author keywords

Atom jumps; Field ion microscopy; Molecular dynamics; Surface diffusion

Indexed keywords

COMPUTER SIMULATION; CRYSTALLINE MATERIALS; MOLECULAR DYNAMICS; SURFACE PROPERTIES; TUNGSTEN;

EID: 33846794637     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfrep.2006.12.001     Document Type: Review
Times cited : (184)

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