Towards the three-dimensional field ion microscope

Surface and Interface Analysis

Volumn 39, Issue 2-3, 2007, Pages 273-277

  Vurpillot, F ^a   Gilbert, M ^a   Deconihout, B ^a  

^a Université de Rouen   (France)

Author keywords

Field ion microscopy; Tomography

Indexed keywords

CRYSTALLOGRAPHY; GRAIN BOUNDARIES; ION MICROSCOPES; PRECIPITATION (CHEMICAL); TOMOGRAPHY;

ATOMIC LINES; FIELD ION MICROSCOPY; PRECIPITATES; RAW RECONSTRUCTIONS;

IMAGE RECONSTRUCTION;

EID: 33847071585     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2490     Document Type: Conference Paper

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