An artificial fingerprint device (AFD): A study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs

IEEE Transactions on Electron Devices

Volumn 50, Issue 6, 2003, Pages 1451-1458

  Maeda, Shigenobu ^a   Kuriyama, Hirotada ^b   Ipposhi, Takashi ^b   Maegawa, Shigeto ^b   Inoue, Yasuo ^b   Inuishi, Masahide ^b   Kotani, Norihiko ^c   Nishimura, Tadashi ^b  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b RENESAS TECHNOLOGY CORP   (Japan)

^c HIROSHIMA INTERNATIONAL UNIVERSITY   (Japan)

Author keywords

Crystals; Identification; Random number generation; Silicon; Silicon on insulator technology; Thin film transistors

Indexed keywords

ARTIFICIAL INTELLIGENCE; PATTERN MATCHING; POLYSILICON; RANDOM NUMBER GENERATION; SILICON ON INSULATOR TECHNOLOGY; THIN FILM TRANSISTORS;

FINGERPRINTING DEVICES;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 0041663673     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.808526     Document Type: Article

References (8)

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