A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis

IUCrJ

Volumn 6, Issue , 2019, Pages 5-17

  Zivanov, Jasenko ^a   Nakane, Takanori ^a   Scheres, Sjors H W ^a  

^a MRC LABORATORY OF MOLECULAR BIOLOGY   (United Kingdom)

Author keywords

Bayesian particle polishing; Beam induced motion correction; Cryo EM; Electron cryo microscopy; Single particle analysis

Indexed keywords

EID: 85059906349     PISSN: None     EISSN: 20522525     Source Type: Journal    
DOI: 10.1107/S205225251801463X     Document Type: Article

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