Transfer learning for one class SVM adaptation to limited data distribution change

Pattern Recognition Letters

Volumn 100, Issue , 2017, Pages 117-123

  Xue, Yongjian ^a   Beauseroy, Pierre ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Distribution change; Fault detection; Kernel adaptation; One class classification; Transfer learning

Indexed keywords

FAULT DETECTION;

DATA DISTRIBUTION; DISTRIBUTION CHANGE; KERNEL ADAPTATION; MULTITASK LEARNING; NUMBER OF SAMPLES; ONE-CLASS CLASSIFICATION; REPRESENTATIVE SAMPLE; TRANSFER LEARNING;

C (PROGRAMMING LANGUAGE);

EID: 85032258241     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2017.10.030     Document Type: Article

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