Enhanced Deep Residual Networks for Single Image Super-Resolution

IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops

Volumn 2017-July, Issue , 2017, Pages 1132-1140

  Lim, Bee ^a   Son, Sanghyun ^a   Kim, Heewon ^a   Nah, Seungjun ^a   Lee, Kyoung Mu ^a  

^a Department of Aerospace Engineering   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; COMPUTER VISION; DEEP NEURAL NETWORKS; NEURAL NETWORKS; OPTICAL RESOLVING POWER; PATTERN RECOGNITION;

BENCHMARK DATASETS; CONVOLUTIONAL NEURAL NETWORK; HIGH RESOLUTION IMAGE; LEARNING TECHNIQUES; RECENT RESEARCHES; STATE-OF-THE-ART METHODS; SUPER RESOLUTION; TRAINING PROCEDURES;

IMAGE ENHANCEMENT;

EID: 85030237937     PISSN: 21607508     EISSN: 21607516     Source Type: Conference Proceeding    
DOI: 10.1109/CVPRW.2017.151     Document Type: Conference Paper

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