A topological twist on materials science

MRS Bulletin

Volumn 39, Issue 3, 2014, Pages 265-279

  Gupta, Sanju ^a   Saxena, Avadh ^b  

^a WESTERN KENTUCKY UNIVERSITY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Defects; Dislocations; Elastic properties; Metrology; Raman spectroscopy; Self assembly

Indexed keywords

BIOMATERIALS; DEFECTS; DISLOCATIONS (CRYSTALS); MEASUREMENT; MEDICAL NANOTECHNOLOGY; POROUS MATERIALS; RAMAN SPECTROSCOPY; SELF ASSEMBLY; TOPOLOGY;

ELASTIC PROPERTIES; MICROSCOPIC STRUCTURES; NANO-POROUS MATERIALS; PREDICTIVE MODELING; SUPRAMOLECULAR ASSEMBLIES; TECHNOLOGICAL APPLICATIONS; TOPOLOGICAL MATERIALS; TOPOLOGICAL NOTIONS;

MATERIALS PROPERTIES;

EID: 85028162563     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2014.28     Document Type: Article

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