ChemCam passive reflectance spectroscopy of surface materials at the Curiosity landing site, Mars

Icarus

Volumn 249, Issue , 2015, Pages 74-92

  Johnson, Jeffrey R ^a   Bell, J F ^b   Bender, S ^c   Blaney, D ^d   Cloutis, E ^e   DeFlores, L ^d   Ehlmann, B ^f   Gasnault, O ^g   Gondet, B ^h   Kinch, K ⁱ   Lemmon, M ^j   Le Mouelic S ^k   Maurice, S ^g   Rice, M ^f   Wiens, R C ^l  

^a JOHNS HOPKINS UNIVERSITY APPLIED PHYSICS LABORATORY   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c PLANETARY SCIENCE INSTITUTE   (United States)

^d CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^e UNIVERSITY OF WINNIPEG   (Canada)

^f CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^g UNIVERSITÉ DE TOULOUSE   (France)

^h UNIVERSITÉ PARIS SUD   (France)

ⁱ UNIVERSITY OF COPENHAGEN   (Denmark)

^j TEXAS A AND M UNIVERSITY   (United States)

^k UNIVERSITÉ DE NANTES   (France)

^l LOS ALAMOS NATIONAL LABORATORY   (United States)

more..

Author keywords

Mars; Mars, surface; Spectroscopy

Indexed keywords

EID: 85028160231     PISSN: 00191035     EISSN: 10902643     Source Type: Journal    
DOI: 10.1016/j.icarus.2014.02.028     Document Type: Article

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