Optical 2-d fourier transform spectroscopy of excitons in semiconductor nanostructures

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 18, Issue 1, 2012, Pages 318-328

  Cundiff, Steven T ^a   Bristow, Alan D ^b   Siemens, Mark ^c   Li, Hebin ^a   Moody, Galan ^a   Karaiskaj, Denis ^d   Dai, Xingcan ^e   Zhang, Tianhao ^f  

^a UNIVERSITY OF COLORADO   (United States)

^b WEST VIRGINIA UNIVERSITY   (United States)

^c UNIVERSITY OF DENVER   (United States)

^d UNIVERSITY OF SOUTH FLORIDA   (United States)

^e TSINGHUA UNIVERSITY   (China)

^f STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

Semiconductor nanostructures; spectroscopy; ultrafast optics

Indexed keywords

EXCITONS; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPY; TEMPERATURE DISTRIBUTION;

EXCITONIC TRANSITION; FOURIER TRANSFORM SPECTROSCOPY; INHOMOGENEOUS BROADENING; SEMICONDUCTOR NANOSTRUCTURES; STRUCTURAL DISORDERS; TEMPERATURE DEPENDENCE; TRANSITION STRUCTURES; ULTRAFAST OPTICS;

NANOSTRUCTURES;

EID: 85027918344     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2011.2123876     Document Type: Review

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