Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 15, 2007, Pages

  Kuznetsova, I ^a   Meier, T ^a,b   Cundiff, S T ^c   Thomas, P ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

^b UNIVERSITY OF PADERBORN   (Germany)

^c UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34848830080     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.153301     Document Type: Article

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