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Volumn 133, Issue 3, 2011, Pages 31012-1-31012-4

40 μm silver flip-chip interconnect technology with solid-state bonding

Author keywords

Cu substrates; Electronic packaging; Flip chip interconnect; Si chips; Silver joints; Solid state bonding

Indexed keywords


EID: 85025203593     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.4004660     Document Type: Article
Times cited : (8)

References (9)
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    • Microstructure, Joint Strength and Failure Mechanisms of SnPb and Pb-Free Solders in BGA Packages
    • Li, M., Lee, K. Y., Olsen, D. R., Chen, W. T., Tan, B. T. C., and Mhaisalkar, S., 2002, “Microstructure, Joint Strength and Failure Mechanisms of SnPb and Pb-Free Solders in BGA Packages,” IEEE Trans. Electron. Packag., 25(3), pp. 185-192.
    • (2002) IEEE Trans. Electron. Packag , vol.25 , Issue.3 , pp. 185-192
    • Li, M.1    Lee, K.Y.2    Olsen, D.R.3    Chen, W.T.4    Tan, B.T.C.5    Mhaisalkar, S.6
  • 3
    • 0035359656 scopus 로고    scopus 로고
    • Pb-Free Solders for Flip-Chip Interconnects
    • Frear, D. R., Jang, J. W., Lin, J. K., and Zhang, C., 2001, “Pb-Free Solders for Flip-Chip Interconnects,” JOM, 53(6), pp. 28-33.
    • (2001) JOM , vol.53 , Issue.6 , pp. 28-33
    • Frear, D.R.1    Jang, J.W.2    Lin, J.K.3    Zhang, C.4
  • 4
    • 33847078941 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, 2005 ed., Assembly and Packaging, 2005.
    • (2005) Assembly and Packaging
  • 5
    • 79953253596 scopus 로고    scopus 로고
    • Silver Flip-Chip Technology by Solid-State Bonding
    • Wang, P. J. and Lee, C. C., 2010, “Silver Flip-Chip Technology by Solid-State Bonding,” J. Electron. Packag., 132(3), p. 035001.
    • (2010) J. Electron. Packag , vol.132 , Issue.3 , pp. 35001
    • Wang, P.J.1    Lee, C.C.2
  • 7
    • 34047106690 scopus 로고    scopus 로고
    • Failure Morphology After Drop Impact Test of Ball Grid Array (BGA) Package With Lead-Free Sn-3.8Ag-0.7Cu and Eutectic SnPb Solders
    • Jang, J. W., De Silva, A. P., Drye, J. E., Post, S. L., Owens, N. L., Lin, J. K., and Frear, D. R., 2007, “Failure Morphology After Drop Impact Test of Ball Grid Array (BGA) Package With Lead-Free Sn-3.8Ag-0.7Cu and Eutectic SnPb Solders,” IEEE Trans. Electron. Packag. Manuf., 30(1), pp. 49-53.
    • (2007) IEEE Trans. Electron. Packag. Manuf , vol.30 , Issue.1 , pp. 49-53
    • Jang, J.W.1    De Silva, A.P.2    Drye, J.E.3    Post, S.L.4    Owens, N.L.5    Lin, J.K.6    Frear, D.R.7
  • 9
    • 33846097185 scopus 로고    scopus 로고
    • Design and Construction of a Compact Vacuum Furnace for Scientific Research
    • Lee, C. C., Wang, D. T., and Choi, W. S., 2006, “Design and Construction of a Compact Vacuum Furnace for Scientific Research,” Rev. Sci. Instrum., 77(12), p. 125104.
    • (2006) Rev. Sci. Instrum , vol.77 , Issue.12 , pp. 125104
    • Lee, C.C.1    Wang, D.T.2    Choi, W.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.