From profile to surface monitoring: SPC for cylindrical surfaces via Gaussian processes

Journal of Quality Technology

Volumn 46, Issue 2, 2014, Pages 95-113

  Colosimo, Bianca M ^a   Cicorella, Paolo ^a   Pacella, Massimo ^b   Blaco, Marzia ^b  

^a POLITECNICO DI MILANO   (Italy)

^b UNIVERSITY OF SALENTO   (Italy)

Author keywords

Cylindrical Surfaces; Geometric Specifications; GP Model; Kriging; Profile Monitoring; Spatial Statistics

Indexed keywords

FITS AND TOLERANCES; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC);

CYLINDRICAL SURFACE; GEOMETRIC TOLERANCE; KRIGING; PARAMETRIC APPROACH; PROFILE MONITORING; SPATIAL STATISTICS; STATISTICAL QUALITY; SURFACE MONITORING;

MONITORING;

EID: 85011043558     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2014.11917956     Document Type: Article

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