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Volumn 123, Issue 9, 2003, Pages 368-375

Process Simulation System for 3D X-Ray Lithography and Development

Author keywords

Deep X ray lithography; Fast Marching Method; PMMA dissolution rate; Simulation

Indexed keywords


EID: 85009579147     PISSN: 13418939     EISSN: 13475525     Source Type: Journal    
DOI: 10.1541/ieejsmas.123.368     Document Type: Article
Times cited : (2)

References (9)
  • 5
    • 0032291285 scopus 로고    scopus 로고
    • Lab eque, and S. Megterty: “Resist dissolution rate and inclined-wall structures in deep x-ray lithography
    • Z. Liu, F. Bouamrane, M. Roulliay, R. K. Kupka, A. Lab eque, and S. Megterty: “Resist dissolution rate and inclined-wall structures in deep x-ray lithography”, J. Micromech. Microeng., Vol.8, pp.293-300 (1998)
    • (1998) J. Micromech. Microeng. , vol.8 , pp. 293-300
    • Liu, Z.1    Bouamrane, F.2    Roulliay, M.3    Kupka, R.K.4
  • 6
    • 85009562295 scopus 로고
    • Defocus Simulation Using Observed Dissolution Rate in Photolithography
    • in Japanese
    • Y. Mimami and A. Sekiguchi: “Defocus Simulation Using Observed Dissolution Rate in Photolithography”, IEICE Trans. Electron., Vol. J76-C-II, No.8, pp.562-570 (1993-8) (in Japanese)
    • (1993) IEICE Trans. Electron. , vol.J76-C-II , Issue.8 , pp. 562-570
    • Mimami, Y.1    Sekiguchi, A.2
  • 7
    • 0036722932 scopus 로고    scopus 로고
    • Investigations of the development rate of irradiated PMMA microstructures in deep X-ray lithography
    • P. Meyer, A El-Kholi, and J. Schulz: “Investigations of the development rate of irradiated PMMA microstructures in deep X-ray lithography”, Microelectronic Engineering, Vol.63, pp.319-328 (2002)
    • (2002) Microelectronic Engineering , vol.63 , pp. 319-328
    • Meyer, P.1    El-Kholi, A.2    Schulz, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.