Raw diffraction data preservation and reuse: Overview, update on practicalities and metadata requirements

IUCrJ

Volumn 4, Issue , 2017, Pages 87-99

  Kroon Batenburg, Loes M J ^a   Helliwell, John R ^b   McMahon, Brian ^c   Terwilliger, Thomas C ^d  

^a UTRECHT UNIVERSITY   (Netherlands)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c International Union of Crystallography   (United Kingdom)

^d LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

data archiving; diversity of crystallographic instrumentation; metadata descriptors for raw data; raw diffraction data

Indexed keywords

EID: 85009115358     PISSN: None     EISSN: 20522525     Source Type: Journal    
DOI: 10.1107/S2052252516018315     Document Type: Review

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