Soft electronic structure modulation of surface (thin-film) and bulk (ceramics) morphologies of TiO 2 -host by Pb-implantation: XPS-and-DFT characterization

Applied Surface Science

Volumn 400, Issue , 2017, Pages 110-117

  Zatsepin, D A ^a,b   Boukhvalov, D W ^c,d   Gavrilov, N V ^e   Zatsepin, A F ^b   Shur, V Ya ^f   Esin, A A ^f   Kim, S S ^g   Kurmaev, E Z ^a,b  

^a INSTITUTE OF METAL PHYSICS   (Russian Federation)

^b URAL FEDERAL UNIVERSITY   (Russian Federation)

^c Hanyang University   (South Korea)

^d URAL FEDERAL UNIVERSITY   (Russian Federation)

^e INSTITUTE OF ELECTROPHYSICS   (Russian Federation)

^f URAL FEDERAL UNIVERSITY   (Russian Federation)

^g Inha University   (South Korea)

Author keywords

Bandgap; DFT modeling; Ion implantation; Lead; Titanium dioxide

Indexed keywords

CERAMIC MATERIALS; CHEMICAL BONDS; DENSITY FUNCTIONAL THEORY; ELECTRONIC STRUCTURE; ENERGY GAP; ION IMPLANTATION; IONS; LEAD; LEAD OXIDE; MODULATION; MORPHOLOGY; SEMICONDUCTOR DOPING; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

BULK MORPHOLOGIES; CLUSTERING EFFECT; DEFECT CLUSTER; DFT MODELING; ION MODULATED; RE-ARRANGEMENT; THEORETICAL STUDY; THIN FILM MORPHOLOGY;

THIN FILMS;

EID: 85007494944     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2016.12.154     Document Type: Article

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