Light effects of the amorphous indium gallium zinc oxide thin-film transistor

Journal of Information Display

Volumn 10, Issue 4, 2009, Pages 171-174

  Lee, Keun Woo ^a   Shin, Hyun Soo ^a   Heo, Kon Yi ^a   Kim, Kyung Min ^a   Kim, Hyun Jae ^a  

^a Yonsei University   (South Korea)

Author keywords

A igzo; Deep level defects; Oxide compound; Photosensitivity; TFT

Indexed keywords

EID: 84991987872     PISSN: 15980316     EISSN: 21581606     Source Type: Journal    
DOI: 10.1080/15980316.2009.9652102     Document Type: Article

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