Precise phase determination with the built-in spectral interferometry in two-dimensional electronic spectroscopy

Optics Letters

Volumn 41, Issue 17, 2016, Pages 4134-4137

  Zhang, Yizhu ^a   Yan, T M ^a   Jiang, Y H ^a,b  

^a SHANGHAI ADVANCED RESEARCH INSTITUTE   (China)

^b SHANGHAITECH UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICS; OPTOELECTRONIC DEVICES;

ABSOLUTE PHASE; DATA FITTING PROCESS; INTERACTION REGION; PHASE AMBIGUITY; PHASE DETERMINATION; PULSE SEQUENCE; SPECTRAL INTERFEROMETRY; TWO-DIMENSIONAL ELECTRONIC SPECTROSCOPIES;

INTERFEROMETRY;

EID: 84987652848     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.41.004134     Document Type: Article

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