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Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer
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Surface profiling by analysis of white-light interferograms in the spatial frequency domain
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High-resolution profilometry by using phase calculation algorithms for spectroscopic analysis of white-light interferograms
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8
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0000410223
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Measurement of the intensity and phase of ultraweak, ultrashort laser pulses
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D. N. Fittinghoff, J. L. Bowie, J. N. Sweetser, R. T. Jennings, M. A. Krumbügel, K. W. DeLong, R. Trebino, and I. A. Walmsley, "Measurement of the intensity and phase of ultraweak, ultrashort laser pulses," Opt. Lett. 21, 884-886 (1996).
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85010131832
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Measurement of the intensity and phase of ultraweak, ultrashort laser pulses: Erratum
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Influence of the calibration of the detector on spectral interferometry
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"'Erratum: Experimental distinction between phase shifts and time delays: implications for femtosecond spectroscopy and coherent control of chemical reactions' [J. Chem. Phys. 111 10934 (1999)],"
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Spectral resolution and sampling issues in Fouriertransform spectral interferometry
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Experimental implementation of Fourier-transform spectral interferometry and its application to the study of spectrometers
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Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single frame techniques
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0001124568
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Measurement of the diameter of an Orionis with the interferometer
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A. A. Michelson and F. G. Pease, "Measurement of the diameter of an Orionis with the interferometer," Astrophys. J. 53, 249-259 (1921).
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0001313475
-
Single-shot measurement of carrier-envelope phase changes by spectral interferometry
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33750296877
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Reduction of fast carrierenvelope phase jitter in femtosecond laser amplifiers
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E. Moon, C. Li, Z. Duan, J. Tackett, K. L. Corwin, B. R. Washburn, and Z. Chang, "Reduction of fast carrierenvelope phase jitter in femtosecond laser amplifiers," Opt. Express 14, 9758-9763 (2006).
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Two dimensional Fourier transform electronic spectroscopy
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Generation of tunable 7-fs ultraviolet pulses: Achromatic phase matching and chirp management
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P. Baum, S. Lochbrunner, and E. Riedle, "Generation of tunable 7-fs ultraviolet pulses: achromatic phase matching and chirp management," Appl. Phys. B 79, 1027-1032 (2004).
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0031275693
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White light dispersion measurements by one- and two-dimensional spectral interference
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Sensitivity advantage of swept source and Fourier domain optical coherence tomography
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23
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84893992242
-
-
From the standard deviation of the data in Fig. 6a of [10], the precision can be estimated as 0.25 fs2
-
From the standard deviation of the data in Fig. 6a of [10], the precision can be estimated as 0.25 fs2.
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24
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0034347480
-
Toward high-precision astrometry with WFPC2. I. Deriving an accurate point-spread function
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Space-variant image restoration by coordinate transformations
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84894009162
-
-
The wavelength axis was given byλp-=670 nm +(p-1) •0.5 nm/pixel for p=1 through N=512. The pulse spectrum was-e-2=- 0 /-2exp- 0-2/2-2- with-2=250 nm2 and 0=800 nm (a FWHM of-75 pixels on the 512 pixel array). The simulated eLSF for each pixel was a convolution of a pixel-centered Gaussian, exp-Pp-2/2-2-, where-=0.53 pixels is constant; a onesided exponential decay,-λp-λp-exp-λp-λp- /wp-; and a 1λpixel wide pixelation function. The final eLSF was repositioned with its maximum on the pixel center. The variation in the eLSF was created with the exponential width, wp=2?tanh-λp-N/2-/40-, producing an eLSF FWHM ranging from 2 to 3.4 pixels.
-
The wavelength axis was given byλp-=670 nm +(p-1) •0.5 nm/pixel for p=1 through N=512. The pulse spectrum was-e-2=- 0 /-2exp- 0-2/2-2- with-2=250 nm2 and 0=800 nm (a FWHM of-75 pixels on the 512 pixel array). The simulated eLSF for each pixel was a convolution of a pixel-centered Gaussian, exp-Pp-2/2-2-, where-=0.53 pixels is constant; a onesided exponential decay,-λp-λp-exp-λp-λp- /wp-; and a 1λpixel wide pixelation function. The final eLSF was repositioned with its maximum on the pixel center. The variation in the eLSF was created with the exponential width, wp=2?tanh-λp-N/2-/40-, producing an eLSF FWHM ranging from 2 to 3.4 pixels.
-
-
-
-
31
-
-
84894005927
-
-
The wavelength axis was given byλp-=670 nm +(p-1) •0.25 nm/pixel for p=1 through N=1024. The eLSF was constructed in the same way described in note [30] except that-=0.21 pixels and wp=0.675-0.125-tanh- λp -N/2- /200-, producing an eLSF FWHM ranging from 1.23 to 1.39 pixels, which was sufficiently undersampled on a grid of 1024 pixels
-
The wavelength axis was given byλp-=670 nm +(p-1) •0.25 nm/pixel for p=1 through N=1024. The eLSF was constructed in the same way described in note [30] except that-=0.21 pixels and wp=0.675-0.125-tanh- λp -N/2- /200-, producing an eLSF FWHM ranging from 1.23 to 1.39 pixels, which was sufficiently undersampled on a grid of 1024 pixels.
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Optimizing Czerny-Turner spectrographs-a comparison between analytic theory and ray tracing
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J. Reader, "Optimizing Czerny-Turner spectrographs-a comparison between analytic theory and ray tracing," J. Opt. Soc. Am. 59, 1189-1194 (1969).
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W. H. Steel, Interferometry, Cambridge Monographs on Physics (Cambridge U. Press, 1967).
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A. E. Siegman, Lasers (University Science Books, 1986).
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R. D. Campbell and D. J. Thompson, in Scientific Detectors for Astronomy 2005, J. E. Beletic, J. W. Beletic, and P. Amico, eds. (Springer, 2005), pp. 507-514.
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Tarrytown, NY personal communication, March 11
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0043173922
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Dispersion oscillations in ultrafast phasecorrection devices
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84893991421
-
-
A 0.05% sinusoidal ripple with a 14 pixel period is expected on the flatfield from this procedure. This is smaller than the shot noise on the interferograms. In principle, the expected ripple could be divided out of the flatfield, but simulated interferograms show that a 0.05% sinusoidal ripple in the flatfield causes less than 0.5 mrad phase ripple, so this was not done
-
A 0.05% sinusoidal ripple with a 14 pixel period is expected on the flatfield from this procedure. This is smaller than the shot noise on the interferograms. In principle, the expected ripple could be divided out of the flatfield, but simulated interferograms show that a 0.05% sinusoidal ripple in the flatfield causes less than 0.5 mrad phase ripple, so this was not done.
-
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43
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84956273943
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Wavelengths and energy-levels of Ar-I and Ar-II based on new interferometric measurements in region 3400-9800 A
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44
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84893996551
-
-
The argon lines used (from [43]) had the following vacuum wavelengths (in nanometers): 912.547 13, 867.032 50, 852.378 34, 826.679 43, 795.036 27, 763.720 78, 738.601 45, 727.494 00, and 696.735 19
-
The argon lines used (from [43]) had the following vacuum wavelengths (in nanometers): 912.547 13, 867.032 50, 852.378 34, 826.679 43, 795.036 27, 763.720 78, 738.601 45, 727.494 00, and 696.735 19.
-
-
-
-
46
-
-
84894009281
-
-
The polynomial was truncated at the quadratic term as the cubic term (predicted by the grating equation) was not well determined. Standard errors for the cubic coefficient, as estimated by least-squares fitting of single calibration spectra, were 30%-150% of its average value-5 10?11 nm/pixel3-. In contrast, the quadratic term was determined to within 1%-3% of its value-4.8 10?7 nm/pixel2-
-
The polynomial was truncated at the quadratic term as the cubic term (predicted by the grating equation) was not well determined. Standard errors for the cubic coefficient, as estimated by least-squares fitting of single calibration spectra, were 30%-150% of its average value-5 10?11 nm/pixel3-. In contrast, the quadratic term was determined to within 1%-3% of its value-4.8 10?7 nm/pixel2-.
-
-
-
-
47
-
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0032021977
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Factors that affect the accuracy of Raman shift measurements on multichannel spectrometers
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A. W. Fountain, T. J. Vickers, and C. K. Mann, "Factors that affect the accuracy of Raman shift measurements on multichannel spectrometers," Appl. Spectrosc. 52, 462-468 (1998).
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Scanning multichannel technique for improved spectrochemical measurements with a CCD camera and its application to Raman-spectroscopy
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V. Deckert and W. Kiefer, "Scanning multichannel technique for improved spectrochemical measurements with a CCD camera and its application to Raman-spectroscopy," Appl. Spectrosc. 46, 322-328 (1992).
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Location accuracy limitations for CCD cameras
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M. Gai, D. Carollo, M. Delbo, M. G. Lattanzi, G. Massone, F. Bertinetto, G. Mana, and S. Cesare, "Location accuracy limitations for CCD cameras," Astron. Astrophys. 367, 362-370 (2001).
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Mana, G.7
Cesare, S.8
-
50
-
-
84893995021
-
-
The standard deviation of the set of calibration constants c1 is 2.0 10?6 nm/pixel, smaller than the 4.4 10?6 nm/pixel average standard error estimated from the fits to individual spectra. The standard deviation of the set of calibration constants c2 is 2.8 10?9 nm/pixel2, also smaller than the 1.8 10?8 nm/pixel2 average standard error of the fits to individual spectra. This means torsion or forward/backward motion of the CCD relative to the image plane is not detectable within the calibration precision and affects the calibration by less than the standard error of c1 and c2
-
The standard deviation of the set of calibration constants c1 is 2.0 10?6 nm/pixel, smaller than the 4.4 10?6 nm/pixel average standard error estimated from the fits to individual spectra. The standard deviation of the set of calibration constants c2 is 2.8 10?9 nm/pixel2, also smaller than the 1.8 10?8 nm/pixel2 average standard error of the fits to individual spectra. This means torsion or forward/backward motion of the CCD relative to the image plane is not detectable within the calibration precision and affects the calibration by less than the standard error of c1 and c2.
-
-
-
-
51
-
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0000638631
-
Interference measurements in the spectra of neon and natural mercury
-
K. Burns, K. B. Adams, and J. Longwell, "Interference measurements in the spectra of neon and natural mercury," J. Opt. Soc. Am. 40, 339-344 (1950).
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52
-
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84893996239
-
-
The neon lines in [51] are defined by vacuum wave numbers, which were inverted to wavelengths. The six lines used had the following vacuum wavelengths (in nanometers): 703.434 88, 717.591 20, 724.715 93, 744.094 35, 837.990 54, and 849.769 00
-
The neon lines in [51] are defined by vacuum wave numbers, which were inverted to wavelengths. The six lines used had the following vacuum wavelengths (in nanometers): 703.434 88, 717.591 20, 724.715 93, 744.094 35, 837.990 54, and 849.769 00.
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