Effect of Cu incorporation on the physical properties of CdS thin films deposited by using the thermal evaporation technique

Journal of the Korean Physical Society

Volumn 69, Issue 4, 2016, Pages 593-597

  Aftab, Faisal ^a   Iqbal, Javaid ^a   Iqbal, Amjid ^b   Mahmood, Arshad ^b   Raza, Qaiser ^b  

^a INTERNATIONAL ISLAMIC UNIVERSITY   (Pakistan)

^b National Institute of Laser and Optronics (NILOP)   (Pakistan)

Author keywords

CdS; Ra; Thin films; XRD

Indexed keywords

EID: 84983628542     PISSN: 03744884     EISSN: 19768524     Source Type: Journal    
DOI: 10.3938/jkps.69.593     Document Type: Article

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