Electrical and optical properties of Sn doped CuInO2 thin films: Conducting atomic force microscopy and spectroscopic ellipsometry studies

Journal of Applied Physics

Volumn 106, Issue 5, 2009, Pages

  Singh, Mandeep ^a   Mehta, B R ^a   Varandani, Deepak ^a   Singh, V N ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BAND-GAP VALUES; COLUMNAR STRUCTURES; CONDUCTING ATOMIC FORCE MICROSCOPY; CRYSTALLITE ORIENTATION; CURRENT DIRECTION; CURRENT FLOWS; DELAFOSSITE STRUCTURE; DIELECTRIC FUNCTIONS; DOPED SAMPLE; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTY; FILM SURFACES; IN-PLANE; PREFERRED ORIENTATIONS; RF MAGNETRON SPUTTERING TECHNIQUE; SN-DOPED; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; STRONG ANISOTROPY; STRUCTURAL DEFECT; UNDOPED FILMS;

ACTIVATION ENERGY; ANISOTROPY; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; COPPER; COPPER COMPOUNDS; CRYSTALLITES; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; MAGNETRON SPUTTERING; OPTICAL CONSTANTS; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; TIN;

CONDUCTIVE FILMS;

EID: 70349334618     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3211941     Document Type: Article

References (22)

1. P. Thilakan and J. Kumar, Vacuum 0042-207X 48, 463 (1997). 10.1016/S0042-207X(96)00309-0
2. L. Znaidi, G. J. A. A. Soller Illia, S. Baenyahia, C. Sanchez, and A. V. Kanaev, Thin Solid Films 0040-6090 428, 257 (2003). 10.1016/S0040-6090(02)01219- 1
3. K. Nomura, N. Shibata, and M. Maeda, J. Cryst. Growth 0022-0248 235, 224 (2002). 10.1016/S0022-0248(01)01773-0 (Pubitemid 34070361)
4. Y. S. Jung and S. S. Lee, J. Cryst. Growth 0022-0248 259, 343 (2003). 10.1016/j.jcrysgro.2003.07.006
5. A. V. Moholkar, S. M. Pawar, K. Y. Rajpure, P. S. Patil, and C. H. Bhosale, J. Phys. Chem. Solids 0022-3697 68, 1981 (2007). 10.1016/j.jpcs.2007. 06.024 (Pubitemid 47488429)
6. P. P. Sahay and R. K. Nath, Sens. Actuators B 0925-4005 133, 222 (2008). 10.1016/j.snb.2008.02.014
7. L. Zhao, Z. Zhou, H. Peng, and R. Cui, Appl. Surf. Sci. 0169-4332 252, 385 (2005). 10.1016/j.apsusc.2005.01.033 (Pubitemid 41276932)
8. V. Khranovskyy, U. Grossner, O. Nilsen, V. Lazorenko, G. V. Lashkarev, B. G. Svensson, and R. Yakimova, Thin Solid Films 0040-6090 515, 472 (2006). 10.1016/j.tsf.2005.12.269 (Pubitemid 44404205)
9. H. Yanagi, K. Ueda, H. Ohta, M. Orita, M. Hirano, and H. Hosono, Solid State Commun. 0038-1098 121, 15 (2002). 10.1016/S0038-1098(01)00439-2
10. C. W. Teplin, T. Kaydanova, D. L. Young, J. D. Perkins, and D. S. Ginley, Appl. Phys. Lett. 0003-6951 85, 3789 (2004). 10.1063/1.1808498
11. M. Singh, V. N. Singh, and B. R. Mehta, J. Nanosci. Nanotechnol. 1533-4880 8, 3889 (2008). 10.1166/jnn.2008.178
12. H. Yanagi, T. Hase, S. Ibuki, K. Ueda, and H. Hosono, Appl. Phys. Lett. 0003-6951 78, 1583 (2001). 10.1063/1.1355673
13. M. Sasaki and M. Shimode, J. Phys. Chem. Solids 0022-3697 64, 1675 (2003). 10.1016/S0022-3697(03)00071-4
14. R. D. Shannon, D. B. Rogers, and C. T. Prewitt, Inorg. Chem. 0020-1669 10, 723 (1971). 10.1021/ic50098a013
15. M. Singh and B. R. Mehta, Appl. Phys. Lett. 0003-6951 93, 192104 (2008). 10.1063/1.2982915
16. S. Adachi, Optical Processes of Crystalline and Amorphous Semiconductors: Materials and Fundamental Issues (Kluwer, Dordrecht, 1971).
17. J. I. Pankove, Optical Processes in Semiconductors (Prentice-hall, Englewood Cliffs, NJ, 1971).
18. R. A. Street, Phys. Rev. Lett. 0031-9007 49, 1187 (1982). 10.1103/PhysRevLett.49.1187
19. E. Burstein, Phys. Rev. 0096-8250 93, 632 (1954). 10.1103/PhysRev.93.632
20. T. S. Moss, Proc. Phys. Soc. London, Sect. B 0370-1301 67, 775 (1954). 10.1088/0370-1301/67/10/306
21. A. K. Mann, D. Varandani, B. R. Mehta, and L. K. Malhotra, J. Appl. Phys. 0021-8979 101, 084304 (2007). 10.1063/1.2718289 (Pubitemid 46685395)
22. T. Suda and K. Kakishita, J. Appl. Phys. 0021-8979 99, 076101 (2006). 10.1063/1.2180541