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Volumn 78, Issue 12, 2015, Pages 1090-1097

A facile method to compare EFTEM maps obtained from materials changing composition over time

Author keywords

Digital image treatment; Elemental maps; in situ EFTEM

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84983196965     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.22589     Document Type: Article
Times cited : (1)

References (7)
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    • Heil, T.1    Gralla, B.2    Epping, M.3    Kohl, H.4
  • 4
    • 68549120747 scopus 로고    scopus 로고
    • Achieving sub-nanometre particle mapping with energy-filtered TEM
    • Lozano-Perez S, de Castro Bernal V, Nicholls RJ. 2009. Achieving sub-nanometre particle mapping with energy-filtered TEM. Ultramicroscopy 109:1217-1228.
    • (2009) Ultramicroscopy , vol.109 , pp. 1217-1228
    • Lozano-Perez, S.1    de Castro Bernal, V.2    Nicholls, R.J.3
  • 5
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    • A tilting procedure to enhance compositional contrast and reduce residual diffraction contrast in energy-filtered TEM imaging of planar interfaces
    • Moore KT, Stach EA, Howe JM, Elbert DC, Veblen DR. 2002. A tilting procedure to enhance compositional contrast and reduce residual diffraction contrast in energy-filtered TEM imaging of planar interfaces. Micron 33:39-51.
    • (2002) Micron , vol.33 , pp. 39-51
    • Moore, K.T.1    Stach, E.A.2    Howe, J.M.3    Elbert, D.C.4    Veblen, D.R.5
  • 7
    • 5444268131 scopus 로고    scopus 로고
    • Energy-filtered transmission electron microscopy: an overview
    • Verbeeck J, Van Dyck D, Van Tendeloo G. 2004. Energy-filtered transmission electron microscopy: an overview. Spectrochim. Acta B 59:1529-1534.
    • (2004) Spectrochim. Acta B , vol.59 , pp. 1529-1534
    • Verbeeck, J.1    Van Dyck, D.2    Van Tendeloo, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.