Avoid the kinks when measuring mobility: Transistor measurements can overstate organic semiconductor charge carrier mobility

Science

Volumn 352, Issue 6293, 2016, Pages 1521-1522

  McCulloch, Iain ^a,b   Salleo, Alberto ^c   Chabinyc, Michael ^d  

^a KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c Stanford University   (United States)

^d University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROKINESIS; ELECTRON; ELECTRONIC EQUIPMENT; MEASUREMENT METHOD; MOBILITY; SENSOR;

ANISOTROPY; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRON; FIELD EFFECT TRANSISTOR; MEASUREMENT; PRIORITY JOURNAL; SEMICONDUCTOR; SHORT SURVEY;

EID: 84976329678     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.aaf9062     Document Type: Short Survey

References (13)

1. A. C. Arias, J. D. MacKenzie, I. McCulloch, J. Rivnay, A. Salleo, Chem. Rev. 110, 3 (2010).
2. A. Facchetti, Chem. Mater. 23, 733 (2011).
3. C. Reese, Z. Bao, J. Appl. Phys. 105, 024506 (2009).
4. H. T. Yi, Y. Chen, K. Czelen, V. Podzorov, Adv. Mater. 23, 5807 (2011).
5. N. F. Mott, E. A. Davis, Electronic Processes in Non-Crystalline Materials (Oxford Univ. Press, 1979).
6. J. Li et al., Sci. Rep. 2, 754 (2012).
7. Z. Chen et al., Adv. Mater. 24, 647 (2012).
8. H.-R. Tseng et al., Adv. Mater. 26, 2993 (2014).
9. E. G. Bittle, J. I. Basham, T. N. Jackson, O. D. Jurchescu, D. J. Gundlach, Nat. Commun. 7, 10908 (2016).
10. T. Okachi, T. Kashiki, K. Ohya, Proc. SPIE 9568, 10.1117/12.2187572 (2015).
11. T. Uemura et al., Adv. Mater. 28, 151 (2016).
12. C. B. Nielsen, M. Turbiez, I. McCulloch, Adv. Mater. 25, 1859 (2013).
13. H. Sirringhaus, Adv. Mater. 26, 1319 (2014).