Segmented infrared image analysis for rotating machinery fault diagnosis

Infrared Physics and Technology

Volumn 77, Issue , 2016, Pages 267-276

  Duan, Lixiang ^a   Yao, Mingchao ^a   Wang, Jinjiang ^a   Bai, Tangbo ^a   Zhang, Laibin ^a  

^a CHINA UNIVERSITY OF PETROLEUM   (China)

Author keywords

Feature enhancement; Infrared image analysis; Machinery fault diagnosis; Region selection

Indexed keywords

EXTRACTION; FAILURE ANALYSIS; FAULT DETECTION; FEATURE EXTRACTION; IMAGE SEGMENTATION; INFRARED IMAGING; MACHINERY;

BACKGROUND INFORMATION; BAYES CLASSIFIER; DEFECT DIAGNOSIS; DISPERSION DEGREE; FEATURE ENHANCEMENT; MACHINERY FAULT DIAGNOSIS; NON-INTRUSIVE TECHNIQUES; REGION SELECTIONS;

IMAGE ANALYSIS;

EID: 84975263124     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infrared.2016.06.011     Document Type: Article

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