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Volumn 241, Issue 1, 2010, Pages

A practical approach to test the scope of FIB-SEM 3D reconstruction

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; ELECTRONS; ION BEAMS; SCANNING ELECTRON MICROSCOPY;

EID: 84969624489     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/241/1/012081     Document Type: Conference Paper
Times cited : (15)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.