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Volumn 241, Issue 1, 2010, Pages
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A practical approach to test the scope of FIB-SEM 3D reconstruction
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON MICROSCOPY;
ELECTRONS;
ION BEAMS;
SCANNING ELECTRON MICROSCOPY;
3D RECONSTRUCTION;
COMMERCIAL SOFTWARE;
CONICAL STRUCTURES;
CONSTANT VOLUMES;
HIGH RESOLUTION;
OVERALL ACCURACIES;
SERIAL SECTIONING;
STATE OF THE ART;
IMAGE RECONSTRUCTION;
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EID: 84969624489
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/241/1/012081 Document Type: Conference Paper |
Times cited : (15)
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References (7)
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