Mitigating effects of non-ideal synaptic device characteristics for on-chip learning

2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015

Volumn , Issue , 2016, Pages 194-199

  Chen, Pai Yu ^a   Lin, Binbin ^b   Wang, I Ting ^c   Hou, Tuo Hung ^c   Ye, Jieping ^b   Vrudhula, Sarma ^a   Seo, Jae Sun ^a   Cao, Yu ^a   Yu, Shimeng ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

cross point array; machine learning; neuromorphic computing; resistive memory; synaptic device

Indexed keywords

ARTIFICIAL INTELLIGENCE; CALIBRATION; CHARACTER RECOGNITION; COMPUTER AIDED DESIGN; LEARNING SYSTEMS;

CROSS-POINT ARRAY; DEVICE CHARACTERISTICS; NEUROMORPHIC COMPUTING; NEUROMORPHIC SYSTEMS; ON-CHIP IMPLEMENTATIONS; RECOGNITION ACCURACY; RESISTIVE MEMORY; SYNAPTIC DEVICE;

LEARNING ALGORITHMS;

EID: 84964556162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2015.7372570     Document Type: Conference Paper

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