Determining the generation profile for silicon solar cells from lumped optical parameters

2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

Volumn , Issue , 2015, Pages

  Fell, Andreas ^a   McIntosh, Keith R ^b  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b PV Lighthouse   (Australia)

Author keywords

device simulation; pathlength enhancement; ray tracing; solar cell modeling; solar cell optics

Indexed keywords

RAY TRACING; SILICON; SILICON WAFERS; SOLAR CELLS;

CELL MODEL; COMPUTATIONAL EFFORT; DEVICE SIMULATIONS; ELECTRICAL CHARACTERISTIC; LUMPED PARAMETER; OPTICAL PARAMETER; PATH LENGTH; SOLAR CELL DEVICES;

SILICON SOLAR CELLS;

EID: 84961566829     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2015.7355952     Document Type: Conference Paper

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