Structural atomic representation for classification

IEEE Transactions on Cybernetics

Volumn 45, Issue 12, 2015, Pages 2905-2913

  Tang, Yuan Yan ^a   Wang, Yulong ^a   Li, Luoqing ^b   Chen, C L Philip ^a  

^a UNIVERSITY OF MACAU   (Macao)

^b HUBEI UNIVERSITY   (China)

Author keywords

Atomic representation (AR); Bayesian analysis; greedy coordinate descent; Markov random field (MRF); subspace

Indexed keywords

COMPUTER VISION; MARKOV PROCESSES; PATTERN RECOGNITION;

BAYESIAN ANALYSIS; CLASSIFICATION METHODS; MARKOV RANDOM FIELDS; MULTI-LEVEL LOGISTICS; REAL DATABASE; STRUCTURAL INFORMATION; TEST DATA; TEST SAMPLES;

ATOMS;

EID: 84960110063     PISSN: 21682267     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCYB.2015.2389232     Document Type: Article

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