Deep transfer metric learning

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 07-12-June-2015, Issue , 2015, Pages 325-333

  Hu, Junlin ^a   Lu, Jiwen ^b   Tan, Yap Peng ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b ADVANCED DIGITAL SCIENCES CENTER   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; MATHEMATICAL TRANSFORMATIONS; NETWORK LAYERS;

FACE VERIFICATION; HIDDEN LAYERS; INTRA-CLASS VARIATION; METRIC LEARNING; NON-LINEAR TRANSFORMATIONS; PERSON RE IDENTIFICATIONS; TARGET DOMAIN; VISUAL RECOGNITION;

PATTERN RECOGNITION;

EID: 84959185419     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2015.7298629     Document Type: Conference Paper

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