Flexible 2D electronics using nanoscale transparent polyimide gate dielectric

Device Research Conference - Conference Digest, DRC

Volumn 2015-August, Issue , 2015, Pages 193-194

  Park, Saungeun ^a   Chang, Hsiao Yu ^a   Rahimi, Somayyeh ^a   Lee, Alvin ^a   Akinwande, Deji ^a  

^a The University of Texas at Austin   (United States)

Author keywords

Capacitance; Dielectric losses; Dielectric measurement; Propagation losses; Silicon; Strain

Indexed keywords

CAPACITANCE; DIELECTRIC LOSSES; DIELECTRIC MATERIALS; FLEXIBLE ELECTRONICS; GRAPHENE TRANSISTORS; RECONFIGURABLE HARDWARE; SILICON; STRAIN;

DIELECTRIC MEASUREMENTS; ELECTRICAL PERFORMANCE; MECHANICAL FLEXIBILITY; NANO SCALE; PROPAGATION LOSS; TRANSPARENT POLYIMIDES;

GATE DIELECTRICS;

EID: 84957662295     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2015.7175628     Document Type: Conference Paper

References (5)

1. D. Akinwande et al, Nat. Commun., vol. 5, pp. 5678, 2014
2. J. Lee et al, 2012 Int. Electron Devices Meet., pp. 14.6.1-14.6.4, 2012
3. H. Y. Chang et al, ACS Nano, vol. 7, no. 6, pp. 5446-5452, 2013
4. J. Lee et al, ACS Nano, vol. 7, no. 9, pp. 7744-7750, 2013
5. C. R. Dean, Nat. Nanotechnol., vol. 5, pp. 722-726, 2010