-
1
-
-
0020098693
-
Any discrimination rule can have an arbitrarily bad probability of error for finite sample size
-
March
-
L. Devroye, Any discrimination rule can have an arbitrarily bad probability of error for finite sample size, IEEE Transactions on Pattern Analysis and Machine Intelligence, 4, 2, March 1982, 154-157.
-
(1982)
IEEE Transactions on Pattern Analysis and Machine Intelligence
, vol.4
, Issue.2
, pp. 154-157
-
-
Devroye, L.1
-
2
-
-
0024053797
-
Automatic pattern recognition: A study of the probability of error
-
July
-
L. Devroye, Automatic pattern recognition: a study of the probability of error, IEEE Transactions on Pattern Analysis and Machine Intelligence, 10, 4, July 1988, 530-599.
-
(1988)
IEEE Transactions on Pattern Analysis and Machine Intelligence
, vol.10
, Issue.4
, pp. 530-599
-
-
Devroye, L.1
-
3
-
-
10044247789
-
Compactness and Complexity of Pattern Recognition Problems
-
in C. Perneel, eds., Royal Military Academy, Brussels, Feb 12
-
R.P.W. Duin, Compactness and Complexity of Pattern Recognition Problems, in C. Perneel, eds., Proc. Int. Symposium on Pattern Recognition, In Memoriam Pierre Devijver, Royal Military Academy, Brussels, Feb 12, 1999, 124-128.
-
(1999)
Proc. Int. Symposium on Pattern Recognition, in Memoriam Pierre Devijver
, pp. 124-128
-
-
Duin, R.1
-
4
-
-
34147144282
-
Classifiers in almost empty spaces
-
Barcelona, September 3-8
-
R.P.W. Duin, Classifiers in almost empty spaces, Proceedings of the 15th International Conference on Pattern Recognition, Barcelona, September 3-8, 2000, II, 1-7.
-
(2000)
Proceedings of the 15Th International Conference on Pattern Recognition
, vol.2
, pp. 1-7
-
-
Duin, R.1
-
5
-
-
0019227672
-
A least upper bound for the average classification accuracy of multiple observers
-
J.L. Engvall, A least upper bound for the average classification accuracy of multiple observers, Pattern Recognition, 12, 415-419.
-
Pattern Recognition
, vol.12
, pp. 415-419
-
-
Engvall, J.L.1
-
7
-
-
0015202473
-
Estimation of classification error
-
December
-
K. Fukunaga, D.L. Kessell, Estimation of classification error, IEEE Transactions on Computers, 20, 12, December 1971, 1521-1527.
-
(1971)
IEEE Transactions on Computers
, vol.20
, Issue.12
, pp. 1521-1527
-
-
Fukunaga, K.1
Kessell, D.L.2
-
8
-
-
0001942829
-
Neural networks and the bias/variance dilemma
-
S. Geman, E. Bienenstock, R. Doursat, Neural networks and the bias/variance dilemma, Neural Computation, 4, 1992, 1-58.
-
(1992)
Neural Computation
, vol.4
, pp. 1-58
-
-
Geman, S.1
Bienenstock, E.2
Doursat, R.3
-
9
-
-
0343999819
-
Distance or similarity measures which respect the internal structure of objects
-
D. Gernert, Distance or similarity measures which respect the internal structure of objects, Methods of Operations Research, 43, 1981, 329-335.
-
(1981)
Methods of Operations Research
, vol.43
, pp. 329-335
-
-
Gernert, D.1
-
10
-
-
0013175523
-
A theoretical framework for dynamic classifier selection
-
Barcelona, September 3-8
-
G. Giacinto, F. Roli, A theoretical framework for dynamic classifier selection, Proceedings of the 15th International Conference on Pattern Recognition, Barcelona, September 3-8, 2000, II, 8-11.
-
(2000)
Proceedings of the 15Th International Conference on Pattern Recognition
, vol.2
, pp. 8-11
-
-
Giacinto, G.1
Roli, F.2
-
11
-
-
0001020401
-
Recent advances in error rate estimation
-
October
-
D.J. Hand, Recent advances in error rate estimation, Pattern Recognition Letters, 4, October 1986, 335-346.
-
(1986)
Pattern Recognition Letters
, vol.4
, pp. 335-346
-
-
Hand, D.J.1
-
12
-
-
34147124589
-
Measuring the Complexity of Classification Problems
-
Barcelona, September 3-8
-
T.K. Ho, M. Basu, Measuring the Complexity of Classification Problems, Proceedings of the 15th International Conference on Pattern Recognition, Barcelona, September 3-8, 2000, II, 43-47.
-
(2000)
Proceedings of the 15Th International Conference on Pattern Recognition
, vol.2
, pp. 43-47
-
-
Ho, T.K.1
Basu, M.2
-
13
-
-
84867095498
-
Complexity of classification problems and comparative advantages of combined classifiers
-
in J. Kittler, F. Roli, eds., Springer
-
T.K. Ho, Complexity of classification problems and comparative advantages of combined classifiers, in J. Kittler, F. Roli, eds., Multiple Classifier Systems, Lecture Notes in Computer Science 1857, Springer, 2000, 97-106.
-
(2000)
Multiple Classifier Systems, Lecture Notes in Computer Science 1857
, pp. 97-106
-
-
Ho, T.K.1
-
14
-
-
0000092441
-
On the nonlinearity of pattern classifiers
-
Vienna, August
-
A. Hoekstra, R.P.W. Duin, On the nonlinearity of pattern classifiers, Proc. of the 13th ICPR, Vienna, August 1996, D271-275.
-
(1996)
Proc. Of the 13Th ICPR
, pp. D271-D275
-
-
Hoekstra, A.1
Duin, R.2
-
15
-
-
0033640646
-
Statistical pattern recognition: A review
-
January
-
A.K. Jain, R.P.W. Duin, J. Mao, Statistical pattern recognition: A review, IEEE Transactions on Pattern Analysis and Machine Intelligence, PAMI-22, 1, January 2000, 4-37.
-
(2000)
IEEE Transactions on Pattern Analysis and Machine Intelligence, PAMI-22
, vol.1
, pp. 4-37
-
-
Jain, A.K.1
Duin, R.2
Mao, J.3
-
16
-
-
0020100273
-
Statistical properties of error estimators in performance assessment of recognition systems
-
March
-
J. Kittler, P.A. Devijver, Statistical properties of error estimators in performance assessment of recognition systems, IEEE Transactions on Pattern Analysis and Machine Intelligence, 4, 2, March 1982, 215-220.
-
(1982)
IEEE Transactions on Pattern Analysis and Machine Intelligence
, vol.4
, Issue.2
, pp. 215-220
-
-
Kittler, J.1
Devijver, P.A.2
-
17
-
-
0032021555
-
On combining classifiers
-
March
-
J. Kittler, M. Hatef, R.P.W. Duin, J. Matas, On combining classifiers, IEEE Transactions on Pattern Analysis and Machine Intelligence, PAMI-20, 3, March 1998, 226-239.
-
(1998)
IEEE Transactions on Pattern Analysis and Machine Intelligence, PAMI-20
, vol.3
, pp. 226-239
-
-
Kittler, J.1
Hatef, M.2
Duin, R.3
Matas, J.4
-
18
-
-
0030343231
-
An overtraining-resistant stochastic modeling method for pattern recognition
-
December
-
E.M. Kleinberg, An overtraining-resistant stochastic modeling method for pattern recognition, Annals of Statistics, 4, 6, December 1996, 2319-2349.
-
(1996)
Annals of Statistics
, vol.4
, Issue.6
, pp. 2319-2349
-
-
Kleinberg, E.M.1
-
19
-
-
34147125588
-
Is independence good for combining classifiers?
-
Barcelona, September 3-8
-
L.I. Kuncheva, C.J. Whitaker, C.A. Shipp, R.P.W. Duin, Is independence good for combining classifiers? Proceedings of the 15th International Conference on Pattern Recognition, Barcelona, September 3-8, 2000, II, 168-171.
-
(2000)
Proceedings of the 15Th International Conference on Pattern Recognition
, vol.2
, pp. 168-171
-
-
Kuncheva, L.I.1
Whitaker, C.J.2
Shipp, C.A.3
Duin, R.4
-
20
-
-
0030342815
-
Combining estimates in regression and classification
-
December
-
M. LeBlanc, R. Tibshirani, Combining estimates in regression and classification, Journal of the American Statistical Association, 91, 436, December 1996, 1641-1650.
-
(1996)
Journal of the American Statistical Association
, vol.91
, Issue.436
, pp. 1641-1650
-
-
Leblanc, M.1
Tibshirani, R.2
-
21
-
-
0023188567
-
Solving of Optimization and Identification Problems by the Committee Methods
-
V.D. Mazurov, A.I. Krivonogov, V.L. Kazantsev, Solving of Optimization and Identification Problems by the Committee Methods, Pattern Recognition, 20, 4, 1987, 371-378.
-
(1987)
Pattern Recognition
, vol.20
, Issue.4
, pp. 371-378
-
-
Mazurov, V.D.1
Krivonogov, A.I.2
Kazantsev, V.L.3
-
22
-
-
0019020917
-
On dimensionality, sample size, classification error, and complexity of classification algorithm in pattern recognition
-
May
-
S. Raudys, V. Pikelis, On dimensionality, sample size, classification error, and complexity of classification algorithm in pattern recognition, IEEE Transactions on Pattern Analysis and Machine Intelligence, 2, 3, May 1980, 242-252.
-
(1980)
IEEE Transactions on Pattern Analysis and Machine Intelligence
, vol.2
, Issue.3
, pp. 242-252
-
-
Raudys, S.1
Pikelis, V.2
-
23
-
-
0026120032
-
Small sample size effects in statistical pattern recognition: Recommendations for practitioners
-
S. Raudys, A.K. Jain, Small sample size effects in statistical pattern recognition: Recommendations for practitioners, IEEE Transactions on Pattern Analysis and Machine Intelligence, 13, 3, 1991, 252-264.
-
(1991)
IEEE Transactions on Pattern Analysis and Machine Intelligence
, vol.13
, Issue.3
, pp. 252-264
-
-
Raudys, S.1
Jain, A.K.2
-
24
-
-
0033220832
-
Meta analysis of classification algorithms for pattern recognition
-
S.Y. Sohn, Meta analysis of classification algorithms for pattern recognition, IEEE Transactions on Pattern Analysis and Machine Intelligence, 21, 11, 1999, 1137-1144.
-
(1999)
IEEE Transactions on Pattern Analysis and Machine Intelligence
, vol.21
, Issue.11
, pp. 1137-1144
-
-
Sohn, S.Y.1
-
25
-
-
0016082639
-
Bibliography on estimation of misclassification
-
July
-
G.T. Toussaint, Bibliography on estimation of misclassification, IEEE Transactions on Information Theory, 20, 4, July 1974, 472-479.
-
(1974)
IEEE Transactions on Information Theory
, vol.20
, Issue.4
, pp. 472-479
-
-
Toussaint, G.T.1
-
26
-
-
0030085913
-
Analysis of decision boundaries in linearly combined neural classifiers
-
K. Tumer, J. Ghosh, Analysis of decision boundaries in linearly combined neural classifiers, Pattern Recognition, 29, 1996, 341-348.
-
(1996)
Pattern Recognition
, vol.29
, pp. 341-348
-
-
Tumer, K.1
Ghosh, J.2
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