Is independence good for combining classifiers?

Proceedings - International Conference on Pattern Recognition

Volumn 15, Issue 2, 2000, Pages 168-171

  Kuncheva, L I ^a   Whitaker, C J ^a   Shipp, C A ^a   Duin, R P W ^b  

^a BANGOR UNIVERSITY   (United Kingdom)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

SOFTWARE ENGINEERING;

CLASSIFIER FUSION; COMBINING CLASSIFIERS; INDIVIDUAL CLASSIFIERS; MAJORITY VOTE; Q STATISTICS; SYNTHETIC EXPERIMENTS;

PATTERN RECOGNITION;

EID: 34147125588     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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